/ INDUSTRY
▣ Smart Display
From TFT-LCD and OLED to Mini/Micro-LED — pixel-level metrology and AI defect classification.
/ CONTEXT
Industry Snapshot
The smart-display industry juggles 8K+ resolution, HDR, Mini/Micro-LED mass transfer, and flexible OLED. A single pixel defect on a million-dpi panel is a yield killer.
/ PAIN
Three Key Challenges
/ 01
Sub-pixel defects (dark/bright dots, mura, shorts) escape conventional AOI.
/ 02
Chromatic uniformity and CIE (x, y) measurement must meet IEC standards.
/ 03
Laser repair/ablation requires fast, precise coordinate feedback.
/ SOLUTION
How LiQung Helps
/ S1
World-class EL/PL/IR imaging metrology (P1, P3).
/ S2
AI Vision Inspection (P6) — Mura/dot classification ≥98% at <120ms inference.
/ S3
Laser repair/modification (P5) and yield SaaS dashboard (P7+P8).
/ STACK
Recommended Stack
Products
- P1 · Optical Metrology
- P3 · Microscopic Imaging
- P5 · Laser Repair
- P6 · AI Vision Inspection
- P7 · Custom SaaS
- P8 · Cloud Monitoring
Custom Services
- S01 · Measurement Script Automation
- S03 · AI Model Training
- S04 · SaaS Platform Development
- S05 · Production-Line API
/ METRICS
Key Numbers & Standards
≥98%
Mura defect classification
<120ms
Edge inference latency
8K+
Supported pixel density
4σ
Chromaticity reproducibility
Applicable Standards:
- IEC 61747
- ISO/IEC 17025
- CIE 1931
- JEITA
Ready to bring AI into your Smart Display line?
24h SLA · Free site assessment.